[ 용    도 ]
High Definition Technology를 기반으로 한 DCC Optic를 이용하여 Background 제거 및 X-선을 Focus 해 줌으로써 미소영역 (1mm Area) 측정 및 Intensity를 높여 줌으로써 기존 EDXRF 대비 탁월한 Detection Limit를 제공하는 RoHS 전용 분석장비이다.

[ 원리 및 이론 ]
X-선 튜브에서 나오는 X-선을 DCC Optic를 이용하여 Background 제거, X-선 Focus 및 Intensity를 강화하여 미소영역 (1mm Area) 측정하여, 시료내의 수 ppm농도의 유해 물질을 정성, 정량 분석을 한다.

[ 응용분야 ]
유해물질 분석 (RoHS & WEEE)

[ 주요특징 ]
  - Easily and simultaneously distinguish coating and substrate layer readings
  - Achieve unprecedented limits of detection for regulated metals
  - Analyze spot areas of 1mm for testing small features or components and irregular shapes
  - Non-destructive measurements; no sample prep required
  - Ease of use in multiple environments
  - Offers rapid screening or precise quantification
  - Automatically embed high quality image with scan data
 
[ 제품사양 ]
  - Elements : Pb, Sb, As, Ba, Cd, Cr, Hg, Se, Br, Cl
  - Analysis Modes : Screening Mode : rapid determination for presence of elements
    QuantificationMode : Accurate and precise determination of elemental concentration
  - Analysis Area : 1mm Diameter
  - Power Consumption : 200W Max.
  - Material Selection Optics : Plastic, Metal, Wood, Glass, Rubber, Leather, Textiles, Bulk Paint
  - Quantification : Test Result : Concentration in substrate in ppm(wt.), Color coded pass/fail indicators
  - Cameras : 1camera, 2images : large angle image of sample close up view of analysis area